Cargando…
In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy
Under ambient conditions, surfaces are rapidly modified and contaminated by absorbance of molecules and a variety of nanoparticles that drastically change their chemical and physical properties. The atomic force microscope tip–sample system can be considered a model system for investigating a variet...
Autores principales: | , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2018
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6278756/ https://www.ncbi.nlm.nih.gov/pubmed/30546989 http://dx.doi.org/10.3762/bjnano.9.271 |
_version_ | 1783378422645391360 |
---|---|
author | Lacasa, Jesús S Almonte, Lisa Colchero, Jaime |
author_facet | Lacasa, Jesús S Almonte, Lisa Colchero, Jaime |
author_sort | Lacasa, Jesús S |
collection | PubMed |
description | Under ambient conditions, surfaces are rapidly modified and contaminated by absorbance of molecules and a variety of nanoparticles that drastically change their chemical and physical properties. The atomic force microscope tip–sample system can be considered a model system for investigating a variety of nanoscale phenomena. In the present work we use atomic force microscopy to directly image nanoscale contamination on surfaces, and to characterize this contamination by using multidimensional spectroscopy techniques. By acquisition of spectroscopy data as a function of tip–sample voltage and tip–sample distance, we are able to determine the contact potential, the Hamaker constant and the effective thickness of the dielectric layer within the tip–sample system. All these properties depend strongly on the contamination within the tip–sample system. We propose to access the state of contamination of real surfaces under ambient conditions using advanced atomic force microscopy techniques. |
format | Online Article Text |
id | pubmed-6278756 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Beilstein-Institut |
record_format | MEDLINE/PubMed |
spelling | pubmed-62787562018-12-13 In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy Lacasa, Jesús S Almonte, Lisa Colchero, Jaime Beilstein J Nanotechnol Full Research Paper Under ambient conditions, surfaces are rapidly modified and contaminated by absorbance of molecules and a variety of nanoparticles that drastically change their chemical and physical properties. The atomic force microscope tip–sample system can be considered a model system for investigating a variety of nanoscale phenomena. In the present work we use atomic force microscopy to directly image nanoscale contamination on surfaces, and to characterize this contamination by using multidimensional spectroscopy techniques. By acquisition of spectroscopy data as a function of tip–sample voltage and tip–sample distance, we are able to determine the contact potential, the Hamaker constant and the effective thickness of the dielectric layer within the tip–sample system. All these properties depend strongly on the contamination within the tip–sample system. We propose to access the state of contamination of real surfaces under ambient conditions using advanced atomic force microscopy techniques. Beilstein-Institut 2018-11-23 /pmc/articles/PMC6278756/ /pubmed/30546989 http://dx.doi.org/10.3762/bjnano.9.271 Text en Copyright © 2018, Lacasa et al. https://creativecommons.org/licenses/by/4.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0). Please note that the reuse, redistribution and reproduction in particular requires that the authors and source are credited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms) |
spellingShingle | Full Research Paper Lacasa, Jesús S Almonte, Lisa Colchero, Jaime In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy |
title | In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy |
title_full | In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy |
title_fullStr | In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy |
title_full_unstemmed | In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy |
title_short | In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy |
title_sort | in situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy |
topic | Full Research Paper |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6278756/ https://www.ncbi.nlm.nih.gov/pubmed/30546989 http://dx.doi.org/10.3762/bjnano.9.271 |
work_keys_str_mv | AT lacasajesuss insitucharacterizationofnanoscalecontaminationsadsorbedinairusingatomicforcemicroscopy AT almontelisa insitucharacterizationofnanoscalecontaminationsadsorbedinairusingatomicforcemicroscopy AT colcherojaime insitucharacterizationofnanoscalecontaminationsadsorbedinairusingatomicforcemicroscopy |