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In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy
Under ambient conditions, surfaces are rapidly modified and contaminated by absorbance of molecules and a variety of nanoparticles that drastically change their chemical and physical properties. The atomic force microscope tip–sample system can be considered a model system for investigating a variet...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6278756/ https://www.ncbi.nlm.nih.gov/pubmed/30546989 http://dx.doi.org/10.3762/bjnano.9.271 |