Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) images of graphene reveal either a triangular or honeycomb pattern at the atomic scale depending on the imaging parameters. The triangular patterns at the atomic scale are particularly difficult to interpret, as the maxima in the...

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Detalles Bibliográficos
Autores principales: Jadidi, Majid Fazeli, Kamber, Umut, Gürlü, Oğuzhan, Özer, H Özgür
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2018
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6278757/
https://www.ncbi.nlm.nih.gov/pubmed/30546992
http://dx.doi.org/10.3762/bjnano.9.274

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6278757/
https://www.ncbi.nlm.nih.gov/pubmed/30546992
http://dx.doi.org/10.3762/bjnano.9.274

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