Failure modes analysis of electrofluidic display under thermal ageing

Dielectric failure as well as optical switching failure in electrofluidic display (EFD) are still a bottleneck for sufficient device lifetime. In this study, a dielectric redundancy-designed multilayer insulator of ParyleneC/AF1600X was applied in an EFD device. The reliability performance was syste...

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Detalles Bibliográficos
Autores principales: Dong, Baoqin, Tang, Biao, Groenewold, Jan, Li, Hui, Zhou, Rui, Henzen, Alexander Victor, Zhou, Guofu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society 2018
Materias:
Engineering
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6281906/
https://www.ncbi.nlm.nih.gov/pubmed/30564404
http://dx.doi.org/10.1098/rsos.181121

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6281906/
https://www.ncbi.nlm.nih.gov/pubmed/30564404
http://dx.doi.org/10.1098/rsos.181121

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