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Failure modes analysis of electrofluidic display under thermal ageing
Dielectric failure as well as optical switching failure in electrofluidic display (EFD) are still a bottleneck for sufficient device lifetime. In this study, a dielectric redundancy-designed multilayer insulator of ParyleneC/AF1600X was applied in an EFD device. The reliability performance was syste...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
The Royal Society
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6281906/ https://www.ncbi.nlm.nih.gov/pubmed/30564404 http://dx.doi.org/10.1098/rsos.181121 |