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Genome-wide association mapping of spot blotch resistance in wheat association mapping initiative (WAMI) panel of spring wheat (Triticum aestivum L.)

Spot blotch (SB) caused by Bipolaris sorokiniana, is one of the most important diseases of wheat in the eastern part of south Asia causing considerable yield loss to the wheat crop. There is an urgent need to identify genetic loci closely associated with resistance to this pathogen for developing re...

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Detalles Bibliográficos
Autores principales:	Ahirwar, Ram Narayan, Mishra, Vinod Kumar, Chand, Ramesh, Budhlakoti, Neeraj, Mishra, Dwijesh Chandra, Kumar, Sundeep, Singh, Shweta, Joshi, Arun Kumar
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Public Library of Science 2018
Materias:	Research Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6296536/ https://www.ncbi.nlm.nih.gov/pubmed/30557301 http://dx.doi.org/10.1371/journal.pone.0208196

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