Cargando…

Electron aspirator using electron–electron scattering in nanoscale silicon

Current enhancement without increasing the input power is a critical issue to be pursued for electronic circuits. However, drivability of metal-oxide-semiconductor (MOS) transistors is limited by the source-injection current, and electrons that have passed through the source unavoidably waste their...

Descripción completa

Detalles Bibliográficos
Autores principales: Firdaus, Himma, Watanabe, Tokinobu, Hori, Masahiro, Moraru, Daniel, Takahashi, Yasuo, Fujiwara, Akira, Ono, Yukinori
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6297221/
https://www.ncbi.nlm.nih.gov/pubmed/30559340
http://dx.doi.org/10.1038/s41467-018-07278-8
_version_ 1783381159815675904
author Firdaus, Himma
Watanabe, Tokinobu
Hori, Masahiro
Moraru, Daniel
Takahashi, Yasuo
Fujiwara, Akira
Ono, Yukinori
author_facet Firdaus, Himma
Watanabe, Tokinobu
Hori, Masahiro
Moraru, Daniel
Takahashi, Yasuo
Fujiwara, Akira
Ono, Yukinori
author_sort Firdaus, Himma
collection PubMed
description Current enhancement without increasing the input power is a critical issue to be pursued for electronic circuits. However, drivability of metal-oxide-semiconductor (MOS) transistors is limited by the source-injection current, and electrons that have passed through the source unavoidably waste their momentum to the phonon bath. Here, we propose the Si electron-aspirator, a nanometer-scaled MOS device with a T-shaped branch, to go beyond this limit. The device utilizes the hydrodynamic nature of electrons due to the electron–electron scattering, by which the injected hot electrons transfer their momentum to cold electrons before they relax with the phonon bath. This momentum transfer induces an electron flow from the grounded side terminal without additional power sources. The operation is demonstrated by observing the output-current enhancement by a factor of about 3 at 8 K, which reveals that the electron–electron scattering can govern the electron transport in nanometer-scaled MOS devices, and increase their effective drivability.
format Online
Article
Text
id pubmed-6297221
institution National Center for Biotechnology Information
language English
publishDate 2018
publisher Nature Publishing Group UK
record_format MEDLINE/PubMed
spelling pubmed-62972212018-12-19 Electron aspirator using electron–electron scattering in nanoscale silicon Firdaus, Himma Watanabe, Tokinobu Hori, Masahiro Moraru, Daniel Takahashi, Yasuo Fujiwara, Akira Ono, Yukinori Nat Commun Article Current enhancement without increasing the input power is a critical issue to be pursued for electronic circuits. However, drivability of metal-oxide-semiconductor (MOS) transistors is limited by the source-injection current, and electrons that have passed through the source unavoidably waste their momentum to the phonon bath. Here, we propose the Si electron-aspirator, a nanometer-scaled MOS device with a T-shaped branch, to go beyond this limit. The device utilizes the hydrodynamic nature of electrons due to the electron–electron scattering, by which the injected hot electrons transfer their momentum to cold electrons before they relax with the phonon bath. This momentum transfer induces an electron flow from the grounded side terminal without additional power sources. The operation is demonstrated by observing the output-current enhancement by a factor of about 3 at 8 K, which reveals that the electron–electron scattering can govern the electron transport in nanometer-scaled MOS devices, and increase their effective drivability. Nature Publishing Group UK 2018-12-17 /pmc/articles/PMC6297221/ /pubmed/30559340 http://dx.doi.org/10.1038/s41467-018-07278-8 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Firdaus, Himma
Watanabe, Tokinobu
Hori, Masahiro
Moraru, Daniel
Takahashi, Yasuo
Fujiwara, Akira
Ono, Yukinori
Electron aspirator using electron–electron scattering in nanoscale silicon
title Electron aspirator using electron–electron scattering in nanoscale silicon
title_full Electron aspirator using electron–electron scattering in nanoscale silicon
title_fullStr Electron aspirator using electron–electron scattering in nanoscale silicon
title_full_unstemmed Electron aspirator using electron–electron scattering in nanoscale silicon
title_short Electron aspirator using electron–electron scattering in nanoscale silicon
title_sort electron aspirator using electron–electron scattering in nanoscale silicon
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6297221/
https://www.ncbi.nlm.nih.gov/pubmed/30559340
http://dx.doi.org/10.1038/s41467-018-07278-8
work_keys_str_mv AT firdaushimma electronaspiratorusingelectronelectronscatteringinnanoscalesilicon
AT watanabetokinobu electronaspiratorusingelectronelectronscatteringinnanoscalesilicon
AT horimasahiro electronaspiratorusingelectronelectronscatteringinnanoscalesilicon
AT morarudaniel electronaspiratorusingelectronelectronscatteringinnanoscalesilicon
AT takahashiyasuo electronaspiratorusingelectronelectronscatteringinnanoscalesilicon
AT fujiwaraakira electronaspiratorusingelectronelectronscatteringinnanoscalesilicon
AT onoyukinori electronaspiratorusingelectronelectronscatteringinnanoscalesilicon