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Multi-Beam Scanning Electron Microscopy for High-Throughput Imaging in Connectomics Research
Major progress has been achieved in recent years in three-dimensional microscopy techniques. This applies to the life sciences in general, but specifically the neuroscientific field has been a main driver for developments regarding volume imaging. In particular, scanning electron microscopy offers n...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Frontiers Media S.A.
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6297274/ https://www.ncbi.nlm.nih.gov/pubmed/30618653 http://dx.doi.org/10.3389/fnana.2018.00112 |
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author | Eberle, Anna Lena Zeidler, Dirk |
author_facet | Eberle, Anna Lena Zeidler, Dirk |
author_sort | Eberle, Anna Lena |
collection | PubMed |
description | Major progress has been achieved in recent years in three-dimensional microscopy techniques. This applies to the life sciences in general, but specifically the neuroscientific field has been a main driver for developments regarding volume imaging. In particular, scanning electron microscopy offers new insights into the organization of cells and tissues by volume imaging methods, such as serial section array tomography, serial block-face imaging or focused ion beam tomography. However, most of these techniques are restricted to relatively small tissue volumes due to the limited acquisition throughput of most standard imaging techniques. Recently, a novel multi-beam scanning electron microscope technology optimized to the imaging of large sample areas has been developed. Complemented by the commercialization of automated sample preparation robots, the mapping of larger, cubic millimeter range tissue volumes at high-resolution is now within reach. This Mini Review will provide a brief overview of the various approaches to electron microscopic volume imaging, with an emphasis on serial section array tomography and multi-beam scanning electron microscopic imaging. |
format | Online Article Text |
id | pubmed-6297274 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Frontiers Media S.A. |
record_format | MEDLINE/PubMed |
spelling | pubmed-62972742019-01-07 Multi-Beam Scanning Electron Microscopy for High-Throughput Imaging in Connectomics Research Eberle, Anna Lena Zeidler, Dirk Front Neuroanat Neuroscience Major progress has been achieved in recent years in three-dimensional microscopy techniques. This applies to the life sciences in general, but specifically the neuroscientific field has been a main driver for developments regarding volume imaging. In particular, scanning electron microscopy offers new insights into the organization of cells and tissues by volume imaging methods, such as serial section array tomography, serial block-face imaging or focused ion beam tomography. However, most of these techniques are restricted to relatively small tissue volumes due to the limited acquisition throughput of most standard imaging techniques. Recently, a novel multi-beam scanning electron microscope technology optimized to the imaging of large sample areas has been developed. Complemented by the commercialization of automated sample preparation robots, the mapping of larger, cubic millimeter range tissue volumes at high-resolution is now within reach. This Mini Review will provide a brief overview of the various approaches to electron microscopic volume imaging, with an emphasis on serial section array tomography and multi-beam scanning electron microscopic imaging. Frontiers Media S.A. 2018-12-11 /pmc/articles/PMC6297274/ /pubmed/30618653 http://dx.doi.org/10.3389/fnana.2018.00112 Text en Copyright © 2018 Eberle and Zeidler. http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms. |
spellingShingle | Neuroscience Eberle, Anna Lena Zeidler, Dirk Multi-Beam Scanning Electron Microscopy for High-Throughput Imaging in Connectomics Research |
title | Multi-Beam Scanning Electron Microscopy for High-Throughput Imaging in Connectomics Research |
title_full | Multi-Beam Scanning Electron Microscopy for High-Throughput Imaging in Connectomics Research |
title_fullStr | Multi-Beam Scanning Electron Microscopy for High-Throughput Imaging in Connectomics Research |
title_full_unstemmed | Multi-Beam Scanning Electron Microscopy for High-Throughput Imaging in Connectomics Research |
title_short | Multi-Beam Scanning Electron Microscopy for High-Throughput Imaging in Connectomics Research |
title_sort | multi-beam scanning electron microscopy for high-throughput imaging in connectomics research |
topic | Neuroscience |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6297274/ https://www.ncbi.nlm.nih.gov/pubmed/30618653 http://dx.doi.org/10.3389/fnana.2018.00112 |
work_keys_str_mv | AT eberleannalena multibeamscanningelectronmicroscopyforhighthroughputimaginginconnectomicsresearch AT zeidlerdirk multibeamscanningelectronmicroscopyforhighthroughputimaginginconnectomicsresearch |