Direct van der Waals Epitaxy of Crack-Free AlN Thin Film on Epitaxial WS(2)

Van der Waals epitaxy (vdWE) has drawn continuous attention, as it is unlimited by lattice-mismatch between epitaxial layers and substrates. Previous reports on the vdWE of III-nitride thin film were mainly based on two-dimensional (2D) materials by plasma pretreatment or pre-doping of other hexagon...

Descripción completa

Detalles Bibliográficos
Autores principales: Yin, Yue, Ren, Fang, Wang, Yunyu, Liu, Zhiqiang, Ao, Jinping, Liang, Meng, Wei, Tongbo, Yuan, Guodong, Ou, Haiyan, Yan, Jianchang, Yi, Xiaoyan, Wang, Junxi, Li, Jinmin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6317269/
https://www.ncbi.nlm.nih.gov/pubmed/30518146
http://dx.doi.org/10.3390/ma11122464

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6317269/
https://www.ncbi.nlm.nih.gov/pubmed/30518146
http://dx.doi.org/10.3390/ma11122464

Ejemplares similares