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On cross-correlations, averages and noise in electron microscopy
Biological samples are radiation-sensitive and require imaging under low-dose conditions to minimize damage. As a result, images contain a high level of noise and exhibit signal-to-noise ratios that are typically significantly smaller than 1. Averaging techniques, either implicit or explicit, are us...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6317458/ https://www.ncbi.nlm.nih.gov/pubmed/30605121 http://dx.doi.org/10.1107/S2053230X18014036 |
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author | Radermacher, Michael Ruiz, Teresa |
author_facet | Radermacher, Michael Ruiz, Teresa |
author_sort | Radermacher, Michael |
collection | PubMed |
description | Biological samples are radiation-sensitive and require imaging under low-dose conditions to minimize damage. As a result, images contain a high level of noise and exhibit signal-to-noise ratios that are typically significantly smaller than 1. Averaging techniques, either implicit or explicit, are used to overcome the limitations imposed by the high level of noise. Averaging of 2D images showing the same molecule in the same orientation results in highly significant projections. A high-resolution structure can be obtained by combining the information from many single-particle images to determine a 3D structure. Similarly, averaging of multiple copies of macromolecular assembly subvolumes extracted from tomographic reconstructions can lead to a virtually noise-free high-resolution structure. Cross-correlation methods are often used in the alignment and classification steps of averaging processes for both 2D images and 3D volumes. However, the high noise level can bias alignment and certain classification results. While other approaches may be implicitly affected, sensitivity to noise is most apparent in multireference alignments, 3D reference-based projection alignments and projection-based volume alignments. Here, the influence of the image signal-to-noise ratio on the value of the cross-correlation coefficient is analyzed and a method for compensating for this effect is provided. |
format | Online Article Text |
id | pubmed-6317458 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-63174582019-01-13 On cross-correlations, averages and noise in electron microscopy Radermacher, Michael Ruiz, Teresa Acta Crystallogr F Struct Biol Commun Cryo-Electron Microscopy Biological samples are radiation-sensitive and require imaging under low-dose conditions to minimize damage. As a result, images contain a high level of noise and exhibit signal-to-noise ratios that are typically significantly smaller than 1. Averaging techniques, either implicit or explicit, are used to overcome the limitations imposed by the high level of noise. Averaging of 2D images showing the same molecule in the same orientation results in highly significant projections. A high-resolution structure can be obtained by combining the information from many single-particle images to determine a 3D structure. Similarly, averaging of multiple copies of macromolecular assembly subvolumes extracted from tomographic reconstructions can lead to a virtually noise-free high-resolution structure. Cross-correlation methods are often used in the alignment and classification steps of averaging processes for both 2D images and 3D volumes. However, the high noise level can bias alignment and certain classification results. While other approaches may be implicitly affected, sensitivity to noise is most apparent in multireference alignments, 3D reference-based projection alignments and projection-based volume alignments. Here, the influence of the image signal-to-noise ratio on the value of the cross-correlation coefficient is analyzed and a method for compensating for this effect is provided. International Union of Crystallography 2019-01-01 /pmc/articles/PMC6317458/ /pubmed/30605121 http://dx.doi.org/10.1107/S2053230X18014036 Text en © Radermacher & Ruiz 2019 http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Cryo-Electron Microscopy Radermacher, Michael Ruiz, Teresa On cross-correlations, averages and noise in electron microscopy |
title | On cross-correlations, averages and noise in electron microscopy |
title_full | On cross-correlations, averages and noise in electron microscopy |
title_fullStr | On cross-correlations, averages and noise in electron microscopy |
title_full_unstemmed | On cross-correlations, averages and noise in electron microscopy |
title_short | On cross-correlations, averages and noise in electron microscopy |
title_sort | on cross-correlations, averages and noise in electron microscopy |
topic | Cryo-Electron Microscopy |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6317458/ https://www.ncbi.nlm.nih.gov/pubmed/30605121 http://dx.doi.org/10.1107/S2053230X18014036 |
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