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Effort-aware and just-in-time defect prediction with neural network

Effort-aware just-in-time (JIT) defect prediction is to rank source code changes based on the likelihood of detects as well as the effort to inspect such changes. Accurate defect prediction algorithms help to find more defects with limited effort. To improve the accuracy of defect prediction, in thi...

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Detalles Bibliográficos
Autores principales: Qiao, Lei, Wang, Yan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6358090/
https://www.ncbi.nlm.nih.gov/pubmed/30707738
http://dx.doi.org/10.1371/journal.pone.0211359
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author Qiao, Lei
Wang, Yan
author_facet Qiao, Lei
Wang, Yan
author_sort Qiao, Lei
collection PubMed
description Effort-aware just-in-time (JIT) defect prediction is to rank source code changes based on the likelihood of detects as well as the effort to inspect such changes. Accurate defect prediction algorithms help to find more defects with limited effort. To improve the accuracy of defect prediction, in this paper, we propose a deep learning based approach for effort-aware just-in-time defect prediction. The key idea of the proposed approach is that neural network and deep learning could be exploited to select useful features for defect prediction because they have been proved excellent at selecting useful features for classification and regression. First, we preprocess ten numerical metrics of code changes, and then feed them to a neural network whose output indicates how likely the code change under test contains bugs. Second, we compute the benefit cost ratio for each code change by dividing the likelihood by its size. Finally, we rank code changes according to their benefit cost ratio. Evaluation results on a well-known data set suggest that the proposed approach outperforms the state-of-the-art approaches on each of the subject projects. It improves the average recall and popt by 15.6% and 8.1%, respectively.
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spelling pubmed-63580902019-02-15 Effort-aware and just-in-time defect prediction with neural network Qiao, Lei Wang, Yan PLoS One Research Article Effort-aware just-in-time (JIT) defect prediction is to rank source code changes based on the likelihood of detects as well as the effort to inspect such changes. Accurate defect prediction algorithms help to find more defects with limited effort. To improve the accuracy of defect prediction, in this paper, we propose a deep learning based approach for effort-aware just-in-time defect prediction. The key idea of the proposed approach is that neural network and deep learning could be exploited to select useful features for defect prediction because they have been proved excellent at selecting useful features for classification and regression. First, we preprocess ten numerical metrics of code changes, and then feed them to a neural network whose output indicates how likely the code change under test contains bugs. Second, we compute the benefit cost ratio for each code change by dividing the likelihood by its size. Finally, we rank code changes according to their benefit cost ratio. Evaluation results on a well-known data set suggest that the proposed approach outperforms the state-of-the-art approaches on each of the subject projects. It improves the average recall and popt by 15.6% and 8.1%, respectively. Public Library of Science 2019-02-01 /pmc/articles/PMC6358090/ /pubmed/30707738 http://dx.doi.org/10.1371/journal.pone.0211359 Text en © 2019 Qiao, Wang http://creativecommons.org/licenses/by/4.0/ This is an open access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/) , which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.
spellingShingle Research Article
Qiao, Lei
Wang, Yan
Effort-aware and just-in-time defect prediction with neural network
title Effort-aware and just-in-time defect prediction with neural network
title_full Effort-aware and just-in-time defect prediction with neural network
title_fullStr Effort-aware and just-in-time defect prediction with neural network
title_full_unstemmed Effort-aware and just-in-time defect prediction with neural network
title_short Effort-aware and just-in-time defect prediction with neural network
title_sort effort-aware and just-in-time defect prediction with neural network
topic Research Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6358090/
https://www.ncbi.nlm.nih.gov/pubmed/30707738
http://dx.doi.org/10.1371/journal.pone.0211359
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