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Effort-aware and just-in-time defect prediction with neural network
Effort-aware just-in-time (JIT) defect prediction is to rank source code changes based on the likelihood of detects as well as the effort to inspect such changes. Accurate defect prediction algorithms help to find more defects with limited effort. To improve the accuracy of defect prediction, in thi...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Public Library of Science
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6358090/ https://www.ncbi.nlm.nih.gov/pubmed/30707738 http://dx.doi.org/10.1371/journal.pone.0211359 |
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author | Qiao, Lei Wang, Yan |
author_facet | Qiao, Lei Wang, Yan |
author_sort | Qiao, Lei |
collection | PubMed |
description | Effort-aware just-in-time (JIT) defect prediction is to rank source code changes based on the likelihood of detects as well as the effort to inspect such changes. Accurate defect prediction algorithms help to find more defects with limited effort. To improve the accuracy of defect prediction, in this paper, we propose a deep learning based approach for effort-aware just-in-time defect prediction. The key idea of the proposed approach is that neural network and deep learning could be exploited to select useful features for defect prediction because they have been proved excellent at selecting useful features for classification and regression. First, we preprocess ten numerical metrics of code changes, and then feed them to a neural network whose output indicates how likely the code change under test contains bugs. Second, we compute the benefit cost ratio for each code change by dividing the likelihood by its size. Finally, we rank code changes according to their benefit cost ratio. Evaluation results on a well-known data set suggest that the proposed approach outperforms the state-of-the-art approaches on each of the subject projects. It improves the average recall and popt by 15.6% and 8.1%, respectively. |
format | Online Article Text |
id | pubmed-6358090 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | Public Library of Science |
record_format | MEDLINE/PubMed |
spelling | pubmed-63580902019-02-15 Effort-aware and just-in-time defect prediction with neural network Qiao, Lei Wang, Yan PLoS One Research Article Effort-aware just-in-time (JIT) defect prediction is to rank source code changes based on the likelihood of detects as well as the effort to inspect such changes. Accurate defect prediction algorithms help to find more defects with limited effort. To improve the accuracy of defect prediction, in this paper, we propose a deep learning based approach for effort-aware just-in-time defect prediction. The key idea of the proposed approach is that neural network and deep learning could be exploited to select useful features for defect prediction because they have been proved excellent at selecting useful features for classification and regression. First, we preprocess ten numerical metrics of code changes, and then feed them to a neural network whose output indicates how likely the code change under test contains bugs. Second, we compute the benefit cost ratio for each code change by dividing the likelihood by its size. Finally, we rank code changes according to their benefit cost ratio. Evaluation results on a well-known data set suggest that the proposed approach outperforms the state-of-the-art approaches on each of the subject projects. It improves the average recall and popt by 15.6% and 8.1%, respectively. Public Library of Science 2019-02-01 /pmc/articles/PMC6358090/ /pubmed/30707738 http://dx.doi.org/10.1371/journal.pone.0211359 Text en © 2019 Qiao, Wang http://creativecommons.org/licenses/by/4.0/ This is an open access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/) , which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited. |
spellingShingle | Research Article Qiao, Lei Wang, Yan Effort-aware and just-in-time defect prediction with neural network |
title | Effort-aware and just-in-time defect prediction with neural network |
title_full | Effort-aware and just-in-time defect prediction with neural network |
title_fullStr | Effort-aware and just-in-time defect prediction with neural network |
title_full_unstemmed | Effort-aware and just-in-time defect prediction with neural network |
title_short | Effort-aware and just-in-time defect prediction with neural network |
title_sort | effort-aware and just-in-time defect prediction with neural network |
topic | Research Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6358090/ https://www.ncbi.nlm.nih.gov/pubmed/30707738 http://dx.doi.org/10.1371/journal.pone.0211359 |
work_keys_str_mv | AT qiaolei effortawareandjustintimedefectpredictionwithneuralnetwork AT wangyan effortawareandjustintimedefectpredictionwithneuralnetwork |