Probe–Sample Interaction-Independent Atomic Force Microscopy–Infrared Spectroscopy: Toward Robust Nanoscale Compositional Mapping

[Image: see text] Nanoscale topological imaging using atomic force microscopy (AFM) combined with infrared (IR) spectroscopy (AFM-IR) is a rapidly emerging modality to record correlated structural and chemical images. Although the expectation is that the spectral data faithfully represents the under...

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Detalles Bibliográficos
Autores principales: Kenkel, Seth, Mittal, Anirudh, Mittal, Shachi, Bhargava, Rohit
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2018
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6361725/
https://www.ncbi.nlm.nih.gov/pubmed/29939013
http://dx.doi.org/10.1021/acs.analchem.8b00823

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