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Apparatus to investigate the insulation impedance and accelerated life-testing of neural interfaces

Objective. Neural interfaces and other implantable micro-devices that use polymer-encapsulated integrated circuits will only be allowed in medical devices when their lifetimes can be estimated from experimental data. An apparatus has been developed and tested that allows hundreds of insulated sample...

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Autores principales: Donaldson, N, Lamont, C, Idil, A Shah, Mentink, M, Perkins, T
Formato: Online Artículo Texto
Lenguaje:English
Publicado: IOP Publishing 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6372141/
https://www.ncbi.nlm.nih.gov/pubmed/30178761
http://dx.doi.org/10.1088/1741-2552/aadeac
_version_ 1783394686264672256
author Donaldson, N
Lamont, C
Idil, A Shah
Mentink, M
Perkins, T
author_facet Donaldson, N
Lamont, C
Idil, A Shah
Mentink, M
Perkins, T
author_sort Donaldson, N
collection PubMed
description Objective. Neural interfaces and other implantable micro-devices that use polymer-encapsulated integrated circuits will only be allowed in medical devices when their lifetimes can be estimated from experimental data. An apparatus has been developed and tested that allows hundreds of insulated samples (interdigitated combs) to be aged under accelerated conditions of high temperature and voltage stress. Occasionally, aging is paused while the sample’s impedance is measured; the impedance spectrogram may show degradation as it progresses before failure. Approach. The design was based on practical considerations which are reviewed. A Solartron Modulab provides the frequency response analyser and the femtoammeter. The apparatus can accommodate batches of samples at several temperatures and with different aging voltage waveforms. It is important to understand features of the spectra that are not due to comb–comb leakage, but come from other places (for example substrate-solution leakage); some have been observed and investigated using SPICE. Main results. The design is described in detail and test results show that it is capable of making measurements over long periods, at least up to 67 °C. Despite the size of the apparatus, background capacitance is about 1 pF and comb–comb capacitances of about 30 pF can be measured down to 10 mHz, an impedance of about 100 GΩ. An important discovery was the advantage of grounding the bathing solution, primarily in that it raises the measurement ceiling. Observation and SPICE simulation shows that leakage from the substrate to the bathing solution can give phase lags  >90°, in contrast to comb–comb leakage which reduces phase lag to  <90°. Significance. The value of this paper is that it will facilitate research into the endurance of small implanted devices because, given a description of a proven apparatus, researchers can start building their own apparatus relatively quickly and with confidence.
format Online
Article
Text
id pubmed-6372141
institution National Center for Biotechnology Information
language English
publishDate 2018
publisher IOP Publishing
record_format MEDLINE/PubMed
spelling pubmed-63721412019-02-20 Apparatus to investigate the insulation impedance and accelerated life-testing of neural interfaces Donaldson, N Lamont, C Idil, A Shah Mentink, M Perkins, T J Neural Eng Paper Objective. Neural interfaces and other implantable micro-devices that use polymer-encapsulated integrated circuits will only be allowed in medical devices when their lifetimes can be estimated from experimental data. An apparatus has been developed and tested that allows hundreds of insulated samples (interdigitated combs) to be aged under accelerated conditions of high temperature and voltage stress. Occasionally, aging is paused while the sample’s impedance is measured; the impedance spectrogram may show degradation as it progresses before failure. Approach. The design was based on practical considerations which are reviewed. A Solartron Modulab provides the frequency response analyser and the femtoammeter. The apparatus can accommodate batches of samples at several temperatures and with different aging voltage waveforms. It is important to understand features of the spectra that are not due to comb–comb leakage, but come from other places (for example substrate-solution leakage); some have been observed and investigated using SPICE. Main results. The design is described in detail and test results show that it is capable of making measurements over long periods, at least up to 67 °C. Despite the size of the apparatus, background capacitance is about 1 pF and comb–comb capacitances of about 30 pF can be measured down to 10 mHz, an impedance of about 100 GΩ. An important discovery was the advantage of grounding the bathing solution, primarily in that it raises the measurement ceiling. Observation and SPICE simulation shows that leakage from the substrate to the bathing solution can give phase lags  >90°, in contrast to comb–comb leakage which reduces phase lag to  <90°. Significance. The value of this paper is that it will facilitate research into the endurance of small implanted devices because, given a description of a proven apparatus, researchers can start building their own apparatus relatively quickly and with confidence. IOP Publishing 2018-12 2018-10-31 /pmc/articles/PMC6372141/ /pubmed/30178761 http://dx.doi.org/10.1088/1741-2552/aadeac Text en © 2018 IOP Publishing Ltd http://creativecommons.org/licenses/by/3.0/ Original content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence (http://creativecommons.org/licenses/by/3.0) . Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
spellingShingle Paper
Donaldson, N
Lamont, C
Idil, A Shah
Mentink, M
Perkins, T
Apparatus to investigate the insulation impedance and accelerated life-testing of neural interfaces
title Apparatus to investigate the insulation impedance and accelerated life-testing of neural interfaces
title_full Apparatus to investigate the insulation impedance and accelerated life-testing of neural interfaces
title_fullStr Apparatus to investigate the insulation impedance and accelerated life-testing of neural interfaces
title_full_unstemmed Apparatus to investigate the insulation impedance and accelerated life-testing of neural interfaces
title_short Apparatus to investigate the insulation impedance and accelerated life-testing of neural interfaces
title_sort apparatus to investigate the insulation impedance and accelerated life-testing of neural interfaces
topic Paper
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6372141/
https://www.ncbi.nlm.nih.gov/pubmed/30178761
http://dx.doi.org/10.1088/1741-2552/aadeac
work_keys_str_mv AT donaldsonn apparatustoinvestigatetheinsulationimpedanceandacceleratedlifetestingofneuralinterfaces
AT lamontc apparatustoinvestigatetheinsulationimpedanceandacceleratedlifetestingofneuralinterfaces
AT idilashah apparatustoinvestigatetheinsulationimpedanceandacceleratedlifetestingofneuralinterfaces
AT mentinkm apparatustoinvestigatetheinsulationimpedanceandacceleratedlifetestingofneuralinterfaces
AT perkinst apparatustoinvestigatetheinsulationimpedanceandacceleratedlifetestingofneuralinterfaces