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Thickness scaling of ferroelectricity in BiFeO(3) by tomographic atomic force microscopy
Nanometer-scale 3D imaging of materials properties is critical for understanding equilibrium states in electronic materials, as well as for optimization of device performance and reliability, even though such capabilities remain a substantial experimental challenge. Tomographic atomic force microsco...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
National Academy of Sciences
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6377454/ https://www.ncbi.nlm.nih.gov/pubmed/30683718 http://dx.doi.org/10.1073/pnas.1806074116 |