QTL for spike-layer uniformity and their influence on yield-related traits in wheat

BACKGROUND: Common wheat (Triticum aestivum L.) is one of the most important food crops worldwide. Wheat spike-layer uniformity related traits (SLURTs) were complex traits that directly affect yield potential and appearance. In this study, quantitative trait locus (QTL) for five SLURTs among inter-t...

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Detalles Bibliográficos
Autores principales: Zhao, Chunhua, Zhang, Na, Wu, Yongzhen, Sun, Han, Liu, Cheng, Fan, Xiaoli, Yan, Xuemei, Xu, Hongxing, Ji, Jun, Cui, Fa
Formato: Online Artículo Texto
Lenguaje:English
Publicado: BioMed Central 2019
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6396499/
https://www.ncbi.nlm.nih.gov/pubmed/30819111
http://dx.doi.org/10.1186/s12863-019-0730-3

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6396499/
https://www.ncbi.nlm.nih.gov/pubmed/30819111
http://dx.doi.org/10.1186/s12863-019-0730-3

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