Coherence and pulse duration characterization of the PAL-XFEL in the hard X-ray regime

We characterize the spatial and temporal coherence properties of hard X-ray pulses from the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL, Pohang, Korea). The measurement of the single-shot speckle contrast, together with the introduction of corrections considering experimental c...

Descripción completa

Detalles Bibliográficos
Autores principales: Yun, Kyuseok, Kim, Sungwon, Kim, Dongjin, Chung, Myungwoo, Jo, Wonhyuk, Hwang, Hyerim, Nam, Daewoong, Kim, Sangsoo, Kim, Jangwoo, Park, Sang-Youn, Kim, Kyung Sook, Song, Changyong, Lee, Sooheyong, Kim, Hyunjung
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6397240/
https://www.ncbi.nlm.nih.gov/pubmed/30824784
http://dx.doi.org/10.1038/s41598-019-39765-3

Ejemplares similares

Ejemplares similares