Evaluation of the performance of classification algorithms for XFEL single-particle imaging data

Using X-ray free-electron lasers (XFELs), it is possible to determine three-dimensional structures of nanoscale particles using single-particle imaging methods. Classification algorithms are needed to sort out the single-particle diffraction patterns from the large amount of XFEL experimental data....

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Detalles Bibliográficos
Autores principales: Shi, Yingchen, Yin, Ke, Tai, Xuecheng, DeMirci, Hasan, Hosseinizadeh, Ahmad, Hogue, Brenda G., Li, Haoyuan, Ourmazd, Abbas, Schwander, Peter, Vartanyants, Ivan A., Yoon, Chun Hong, Aquila, Andrew, Liu, Haiguang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6400180/
https://www.ncbi.nlm.nih.gov/pubmed/30867930
http://dx.doi.org/10.1107/S2052252519001854

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