Pushing the boundaries of total scattering methods

Atomic pair distribution (PDF) analysis has proven to be an exceptionally robust tool for probing the structure of amorphous, crystalline and crystallographically challenged materials. This issue of IUCrJ features a significant step forward in X-ray PDF methodology for thin films, with substantial i...

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Detalles Bibliográficos
Autor principal: Koch, Robert J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Scientific Commentaries
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6400198/
https://www.ncbi.nlm.nih.gov/pubmed/30867912
http://dx.doi.org/10.1107/S2052252519002847
Descripción
Sumario:Atomic pair distribution (PDF) analysis has proven to be an exceptionally robust tool for probing the structure of amorphous, crystalline and crystallographically challenged materials. This issue of IUCrJ features a significant step forward in X-ray PDF methodology for thin films, with substantial improvements in both sensitivity and time resolution.

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