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Pushing the boundaries of total scattering methods
Atomic pair distribution (PDF) analysis has proven to be an exceptionally robust tool for probing the structure of amorphous, crystalline and crystallographically challenged materials. This issue of IUCrJ features a significant step forward in X-ray PDF methodology for thin films, with substantial i...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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International Union of Crystallography
2019
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6400198/ https://www.ncbi.nlm.nih.gov/pubmed/30867912 http://dx.doi.org/10.1107/S2052252519002847 |