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Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector

Electron ptychography has recently attracted considerable interest for high resolution phase-sensitive imaging. However, to date studies have been mainly limited to radiation resistant samples as the electron dose required to record a ptychographic dataset is too high for use with beam-sensitive mat...

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Detalles Bibliográficos
Autores principales: Song, Jiamei, Allen, Christopher S., Gao, Si, Huang, Chen, Sawada, Hidetaka, Pan, Xiaoqing, Warner, Jamie, Wang, Peng, Kirkland, Angus I.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6408533/
https://www.ncbi.nlm.nih.gov/pubmed/30850641
http://dx.doi.org/10.1038/s41598-019-40413-z
Descripción
Sumario:Electron ptychography has recently attracted considerable interest for high resolution phase-sensitive imaging. However, to date studies have been mainly limited to radiation resistant samples as the electron dose required to record a ptychographic dataset is too high for use with beam-sensitive materials. Here we report defocused electron ptychography using a fast, direct-counting detector to reconstruct the transmission function, which is in turn related to the electrostatic potential of a two-dimensional material at atomic resolution under various low dose conditions.