Synthesis and characterization of single-phase epitaxial Cr(2)N thin films by reactive magnetron sputtering

Cr(2)N is commonly found as a minority phase or inclusion in stainless steel, CrN-based hard coatings, etc. However, studies on phase-pure material for characterization of fundamental properties are limited. Here, Cr(2)N thin films were deposited by reactive magnetron sputtering onto (0001) sapphire substrates. X-ray diffraction and pole figure texture analysis show Cr(2)N (0001) epitaxial growth. Scanning electron microscopy imaging shows a smooth surface, while transmission electron microscopy and X-ray reflectivity show a uniform and dense film with a density of 6.6 g cm(−3), which is comparable to theoretical bulk values. Annealing the films in air at 400 °C for 96 h shows little signs of oxidation. Nano-indentation shows an elastic–plastic behavior with H = 18.9 GPa and E(r) = 265 GPa. The moderate thermal conductivity is 12 W m(−1) K(−1), and the electrical resistivity is 70 μΩ cm. This combination of properties means that Cr(2)N may be of interest in applications such as protective coatings, diffusion barriers, capping layers and contact materials.