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Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers
For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick–...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6412172/ https://www.ncbi.nlm.nih.gov/pubmed/30855243 http://dx.doi.org/10.1107/S1600577519001802 |
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author | Heimann, Philip Reid, Alexander Feng, Yiping Fritz, David |
author_facet | Heimann, Philip Reid, Alexander Feng, Yiping Fritz, David |
author_sort | Heimann, Philip |
collection | PubMed |
description | For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick–Baez mirror chamber with the detectors located above the vertically reflecting mirror. The linearity, noise and position sensitivity of the detectors have been characterized. The photodiode responsivity is suitable for high pulse energies. The microchannel plate detector shows sufficient responsivity over a wide range of pulse energies. The relative signal from the two photodiodes provides a sensitive measure of the X-ray beam position. The fluorescence intensity monitor provides intensity normalization while being compatible with high incident power, a 0.93 MHz repetition rate and ultra-high vacuum. |
format | Online Article Text |
id | pubmed-6412172 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-64121722019-04-04 Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers Heimann, Philip Reid, Alexander Feng, Yiping Fritz, David J Synchrotron Radiat Research Papers For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick–Baez mirror chamber with the detectors located above the vertically reflecting mirror. The linearity, noise and position sensitivity of the detectors have been characterized. The photodiode responsivity is suitable for high pulse energies. The microchannel plate detector shows sufficient responsivity over a wide range of pulse energies. The relative signal from the two photodiodes provides a sensitive measure of the X-ray beam position. The fluorescence intensity monitor provides intensity normalization while being compatible with high incident power, a 0.93 MHz repetition rate and ultra-high vacuum. International Union of Crystallography 2019-02-22 /pmc/articles/PMC6412172/ /pubmed/30855243 http://dx.doi.org/10.1107/S1600577519001802 Text en © Philip Heimann et al. 2019 http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Research Papers Heimann, Philip Reid, Alexander Feng, Yiping Fritz, David Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers |
title | Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers |
title_full | Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers |
title_fullStr | Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers |
title_full_unstemmed | Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers |
title_short | Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers |
title_sort | fluorescence intensity monitors as intensity and beam-position diagnostics for x-ray free-electron lasers |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6412172/ https://www.ncbi.nlm.nih.gov/pubmed/30855243 http://dx.doi.org/10.1107/S1600577519001802 |
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