Cargando…

Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers

For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick–...

Descripción completa

Detalles Bibliográficos
Autores principales: Heimann, Philip, Reid, Alexander, Feng, Yiping, Fritz, David
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6412172/
https://www.ncbi.nlm.nih.gov/pubmed/30855243
http://dx.doi.org/10.1107/S1600577519001802
_version_ 1783402543928311808
author Heimann, Philip
Reid, Alexander
Feng, Yiping
Fritz, David
author_facet Heimann, Philip
Reid, Alexander
Feng, Yiping
Fritz, David
author_sort Heimann, Philip
collection PubMed
description For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick–Baez mirror chamber with the detectors located above the vertically reflecting mirror. The linearity, noise and position sensitivity of the detectors have been characterized. The photodiode responsivity is suitable for high pulse energies. The microchannel plate detector shows sufficient responsivity over a wide range of pulse energies. The relative signal from the two photodiodes provides a sensitive measure of the X-ray beam position. The fluorescence intensity monitor provides intensity normalization while being compatible with high incident power, a 0.93 MHz repetition rate and ultra-high vacuum.
format Online
Article
Text
id pubmed-6412172
institution National Center for Biotechnology Information
language English
publishDate 2019
publisher International Union of Crystallography
record_format MEDLINE/PubMed
spelling pubmed-64121722019-04-04 Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers Heimann, Philip Reid, Alexander Feng, Yiping Fritz, David J Synchrotron Radiat Research Papers For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick–Baez mirror chamber with the detectors located above the vertically reflecting mirror. The linearity, noise and position sensitivity of the detectors have been characterized. The photodiode responsivity is suitable for high pulse energies. The microchannel plate detector shows sufficient responsivity over a wide range of pulse energies. The relative signal from the two photodiodes provides a sensitive measure of the X-ray beam position. The fluorescence intensity monitor provides intensity normalization while being compatible with high incident power, a 0.93 MHz repetition rate and ultra-high vacuum. International Union of Crystallography 2019-02-22 /pmc/articles/PMC6412172/ /pubmed/30855243 http://dx.doi.org/10.1107/S1600577519001802 Text en © Philip Heimann et al. 2019 http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/4.0/
spellingShingle Research Papers
Heimann, Philip
Reid, Alexander
Feng, Yiping
Fritz, David
Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers
title Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers
title_full Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers
title_fullStr Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers
title_full_unstemmed Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers
title_short Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers
title_sort fluorescence intensity monitors as intensity and beam-position diagnostics for x-ray free-electron lasers
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6412172/
https://www.ncbi.nlm.nih.gov/pubmed/30855243
http://dx.doi.org/10.1107/S1600577519001802
work_keys_str_mv AT heimannphilip fluorescenceintensitymonitorsasintensityandbeampositiondiagnosticsforxrayfreeelectronlasers
AT reidalexander fluorescenceintensitymonitorsasintensityandbeampositiondiagnosticsforxrayfreeelectronlasers
AT fengyiping fluorescenceintensitymonitorsasintensityandbeampositiondiagnosticsforxrayfreeelectronlasers
AT fritzdavid fluorescenceintensitymonitorsasintensityandbeampositiondiagnosticsforxrayfreeelectronlasers