Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers

For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick–...

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Detalles Bibliográficos
Autores principales: Heimann, Philip, Reid, Alexander, Feng, Yiping, Fritz, David
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6412172/
https://www.ncbi.nlm.nih.gov/pubmed/30855243
http://dx.doi.org/10.1107/S1600577519001802

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