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Thermoluminescent microparticle thermal history sensors

While there are innumerable devices that measure temperature, the nonvolatile measurement of thermal history is far more difficult, particularly for sensors embedded in extreme environments such as fires and explosions. In this review, an extensive analysis is given of one such technology: thermolum...

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Autores principales: Talghader, Joseph J., Mah, Merlin L., Yukihara, Eduardo G., Coleman, Adam C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6444729/
https://www.ncbi.nlm.nih.gov/pubmed/31057831
http://dx.doi.org/10.1038/micronano.2016.37
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author Talghader, Joseph J.
Mah, Merlin L.
Yukihara, Eduardo G.
Coleman, Adam C.
author_facet Talghader, Joseph J.
Mah, Merlin L.
Yukihara, Eduardo G.
Coleman, Adam C.
author_sort Talghader, Joseph J.
collection PubMed
description While there are innumerable devices that measure temperature, the nonvolatile measurement of thermal history is far more difficult, particularly for sensors embedded in extreme environments such as fires and explosions. In this review, an extensive analysis is given of one such technology: thermoluminescent microparticles. These are transparent dielectrics with a large distribution of trap states that can store charge carriers over very long periods of time. In their simplest form, the population of these traps is dictated by an Arrhenius expression, which is highly dependent on temperature. A particle with filled traps that is exposed to high temperatures over a short period of time will preferentially lose carriers in shallow traps. This depopulation leaves a signature on the particle luminescence, which can be used to determine the temperature and time of the thermal event. Particles are prepared—many months in advance of a test, if desired—by exposure to deep ultraviolet, X-ray, beta, or gamma radiation, which fills the traps with charge carriers. Luminescence can be extracted from one or more particles regardless of whether or not they are embedded in debris or other inert materials. Testing and analysis of the method is demonstrated using laboratory experiments with microheaters and high energy explosives in the field. It is shown that the thermoluminescent materials LiF:Mg,Ti, MgB(4)O(7):Dy,Li, and CaSO(4):Ce,Tb, among others, provide accurate measurements of temperature in the 200 to 500 °C range in a variety of high-explosive environments.
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spelling pubmed-64447292019-05-03 Thermoluminescent microparticle thermal history sensors Talghader, Joseph J. Mah, Merlin L. Yukihara, Eduardo G. Coleman, Adam C. Microsyst Nanoeng Review Article While there are innumerable devices that measure temperature, the nonvolatile measurement of thermal history is far more difficult, particularly for sensors embedded in extreme environments such as fires and explosions. In this review, an extensive analysis is given of one such technology: thermoluminescent microparticles. These are transparent dielectrics with a large distribution of trap states that can store charge carriers over very long periods of time. In their simplest form, the population of these traps is dictated by an Arrhenius expression, which is highly dependent on temperature. A particle with filled traps that is exposed to high temperatures over a short period of time will preferentially lose carriers in shallow traps. This depopulation leaves a signature on the particle luminescence, which can be used to determine the temperature and time of the thermal event. Particles are prepared—many months in advance of a test, if desired—by exposure to deep ultraviolet, X-ray, beta, or gamma radiation, which fills the traps with charge carriers. Luminescence can be extracted from one or more particles regardless of whether or not they are embedded in debris or other inert materials. Testing and analysis of the method is demonstrated using laboratory experiments with microheaters and high energy explosives in the field. It is shown that the thermoluminescent materials LiF:Mg,Ti, MgB(4)O(7):Dy,Li, and CaSO(4):Ce,Tb, among others, provide accurate measurements of temperature in the 200 to 500 °C range in a variety of high-explosive environments. Nature Publishing Group 2016-08-26 /pmc/articles/PMC6444729/ /pubmed/31057831 http://dx.doi.org/10.1038/micronano.2016.37 Text en Copyright © 2016 © 2016 Institute of Electronics, Chinese Academy of Sciences http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Review Article
Talghader, Joseph J.
Mah, Merlin L.
Yukihara, Eduardo G.
Coleman, Adam C.
Thermoluminescent microparticle thermal history sensors
title Thermoluminescent microparticle thermal history sensors
title_full Thermoluminescent microparticle thermal history sensors
title_fullStr Thermoluminescent microparticle thermal history sensors
title_full_unstemmed Thermoluminescent microparticle thermal history sensors
title_short Thermoluminescent microparticle thermal history sensors
title_sort thermoluminescent microparticle thermal history sensors
topic Review Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6444729/
https://www.ncbi.nlm.nih.gov/pubmed/31057831
http://dx.doi.org/10.1038/micronano.2016.37
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