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Electronic transport in planar atomic-scale structures measured by two-probe scanning tunneling spectroscopy
Miniaturization of electronic circuits into the single-atom level requires novel approaches to characterize transport properties. Due to its unrivaled precision, scanning probe microscopy is regarded as the method of choice for local characterization of atoms and single molecules supported on surfac...
| Autores principales: | , , , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6450957/ https://www.ncbi.nlm.nih.gov/pubmed/30952953 http://dx.doi.org/10.1038/s41467-019-09315-6 |