Optimal principal component analysis of STEM XEDS spectrum images

STEM XEDS spectrum images can be drastically denoised by application of the principal component analysis (PCA). This paper looks inside the PCA workflow step by step on an example of a complex semiconductor structure consisting of a number of different phases. Typical problems distorting the princip...

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Detalles Bibliográficos
Autores principales: Potapov, Pavel, Lubk, Axel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2019
Materias:
Research
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6456488/
https://www.ncbi.nlm.nih.gov/pubmed/31032174
http://dx.doi.org/10.1186/s40679-019-0066-0

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6456488/
https://www.ncbi.nlm.nih.gov/pubmed/31032174
http://dx.doi.org/10.1186/s40679-019-0066-0

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