Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits

The measurement of minority carrier lifetimes is vital to determining the material quality and operational bandwidth of a broad range of optoelectronic devices. Typically, these measurements are made by recording the temporal decay of a carrier-concentration-dependent material property following pul...

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Detalles Bibliográficos
Autores principales: Dev, Sukrith, Wang, Yinan, Kim, Kyounghwan, Zamiri, Marziyeh, Kadlec, Clark, Goldflam, Michael, Hawkins, Samuel, Shaner, Eric, Kim, Jin, Krishna, Sanjay, Allen, Monica, Allen, Jeffery, Tutuc, Emanuel, Wasserman, Daniel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6456730/
https://www.ncbi.nlm.nih.gov/pubmed/30967546
http://dx.doi.org/10.1038/s41467-019-09602-2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6456730/
https://www.ncbi.nlm.nih.gov/pubmed/30967546
http://dx.doi.org/10.1038/s41467-019-09602-2

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