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Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits
The measurement of minority carrier lifetimes is vital to determining the material quality and operational bandwidth of a broad range of optoelectronic devices. Typically, these measurements are made by recording the temporal decay of a carrier-concentration-dependent material property following pul...
| Autores principales: | , , , , , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6456730/ https://www.ncbi.nlm.nih.gov/pubmed/30967546 http://dx.doi.org/10.1038/s41467-019-09602-2 |