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Damage from Coexistence of Ferroelectric and Antiferroelectric Domains and Clustering of O Vacancies in PZT: An Elastic and Raman Study

It is often suggested that oxygen vacancies (V [Formula: see text]) are involved in fatigue and pinning of domain walls in ferroelectric (FE) materials, but generally without definite evidence or models. Here the progress of damage induced by the coexistence of FE and antiferroelectric (AFE) domains...

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Detalles Bibliográficos
Autores principales: Cordero, Francesco, Buixaderas, Elena, Galassi, Carmen
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6472040/
https://www.ncbi.nlm.nih.gov/pubmed/30909415
http://dx.doi.org/10.3390/ma12060957