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Thin Film Analysis by Nanomechanical Infrared Spectroscopy
[Image: see text] There is a fundamental need for techniques for thin film characterization. The current options for obtaining infrared (IR) spectra typically suffer from low signal-to-noise-ratios (SNRs) for sample thicknesses confined to a few nanometers. We present nanomechanical infrared spectro...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2019
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6492230/ https://www.ncbi.nlm.nih.gov/pubmed/31058251 http://dx.doi.org/10.1021/acsomega.9b00276 |