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Metamaterial emitter for thermophotovoltaics stable up to 1400 °C

High temperature stable selective emitters can significantly increase efficiency and radiative power in thermophotovoltaic (TPV) systems. However, optical properties of structured emitters reported so far degrade at temperatures approaching 1200 °C due to various degradation mechanisms. We have real...

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Detalles Bibliográficos
Autores principales: Chirumamilla, Manohar, Krishnamurthy, Gnanavel Vaidhyanathan, Knopp, Katrin, Krekeler, Tobias, Graf, Matthias, Jalas, Dirk, Ritter, Martin, Störmer, Michael, Petrov, Alexander Yu, Eich, Manfred
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6510906/
https://www.ncbi.nlm.nih.gov/pubmed/31076610
http://dx.doi.org/10.1038/s41598-019-43640-6
Descripción
Sumario:High temperature stable selective emitters can significantly increase efficiency and radiative power in thermophotovoltaic (TPV) systems. However, optical properties of structured emitters reported so far degrade at temperatures approaching 1200 °C due to various degradation mechanisms. We have realized a 1D structured emitter based on a sputtered W-HfO(2) layered metamaterial and demonstrated desired band edge spectral properties at 1400 °C. To the best of our knowledge the temperature of 1400 °C is the highest reported for a structured emitter, so far. The spatial confinement and absence of edges stabilizes the W-HfO(2) multilayer system to temperatures unprecedented for other nanoscaled W-structures. Only when this confinement is broken W starts to show the well-known self-diffusion behavior transforming to spherical shaped W-islands. We further show that the oxidation of W by atmospheric oxygen could be prevented by reducing the vacuum pressure below 10(−5) mbar. When oxidation is mitigated we observe that the 20 nm spatially confined W films survive temperatures up to 1400 °C. The demonstrated thermal stability is limited by grain growth in HfO(2), which leads to a rupture of the W-layers, thus, to a degradation of the multilayer system at 1450 °C.