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High-Resolution Crack Localization Approach Based on Diffraction Wave

The delay-and-sum imaging algorithm is a promising crack localization approach for crack detection and monitoring of key structural regions. Most studies successfully offer a hole-like damage position. However, cracks are more common than hole-like damages in a structure. To solve this issue, this p...

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Detalles Bibliográficos
Autores principales: Mu, Weilei, Sun, Jiangang, Liu, Guijie, Wang, Shuqing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6514786/
https://www.ncbi.nlm.nih.gov/pubmed/31027291
http://dx.doi.org/10.3390/s19081951
Descripción
Sumario:The delay-and-sum imaging algorithm is a promising crack localization approach for crack detection and monitoring of key structural regions. Most studies successfully offer a hole-like damage position. However, cracks are more common than hole-like damages in a structure. To solve this issue, this paper presents a crack localization approach, based on diffraction wave theory, which is capable of imaging crack endpoints. The guided wave propagated to the crack endpoints and transformed into a diffraction wave. A line sensor array was used to record the diffraction waveform. Then, dispersion compensation was applied to shorten the dispersive wave packets and separate the overlapping wave packets. Subsequently, half-wave compensation was executed to improve the localization accuracy. Finally, the effectiveness of this high-resolution crack localization method was validated by an experimental example.