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Simulation of Radiation Damage for Silicon Drift Detector
Silicon drift detector with high sensitivity and energy resolution is an advanced detector which is suitable to be used in deep space detection. To study and reveal the radiation damage of the silicon drift detector (SDD) in a deep-space environment, which will degrade the detector performance, in t...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6515204/ https://www.ncbi.nlm.nih.gov/pubmed/31013874 http://dx.doi.org/10.3390/s19081767 |
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author | Liu, Yang Zhu, Tengfei Yao, Jianxi Ouyang, Xiaoping |
author_facet | Liu, Yang Zhu, Tengfei Yao, Jianxi Ouyang, Xiaoping |
author_sort | Liu, Yang |
collection | PubMed |
description | Silicon drift detector with high sensitivity and energy resolution is an advanced detector which is suitable to be used in deep space detection. To study and reveal the radiation damage of the silicon drift detector (SDD) in a deep-space environment, which will degrade the detector performance, in this paper, the SDD radiation damage effects and mechanics, including displacement damage and ionization damage, for irradiations of different energy of neutrons and gammas are investigated using Geant4 simulation. The results indicate the recoil atoms distribution generated by neutrons in SDD is uniform, and recoil atoms’ energy is mainly in the low energy region. For secondary particles produced by neutron irradiation, a large energy loss in inelastic scattering and fission reactions occur, and neutron has a significant nuclear reaction. The energy deposition caused by gammas irradiation is linear with the thickness of SDD; the secondary electron energy distribution produced by gamma irradiation is from several eV to incident particle energy. As the scattering angle of secondary electron increases, the number of secondary electrons decreases. Therefore, a reasonable detector epitaxial thickness should be set in the anti-irradiation design of SDD. |
format | Online Article Text |
id | pubmed-6515204 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-65152042019-05-30 Simulation of Radiation Damage for Silicon Drift Detector Liu, Yang Zhu, Tengfei Yao, Jianxi Ouyang, Xiaoping Sensors (Basel) Article Silicon drift detector with high sensitivity and energy resolution is an advanced detector which is suitable to be used in deep space detection. To study and reveal the radiation damage of the silicon drift detector (SDD) in a deep-space environment, which will degrade the detector performance, in this paper, the SDD radiation damage effects and mechanics, including displacement damage and ionization damage, for irradiations of different energy of neutrons and gammas are investigated using Geant4 simulation. The results indicate the recoil atoms distribution generated by neutrons in SDD is uniform, and recoil atoms’ energy is mainly in the low energy region. For secondary particles produced by neutron irradiation, a large energy loss in inelastic scattering and fission reactions occur, and neutron has a significant nuclear reaction. The energy deposition caused by gammas irradiation is linear with the thickness of SDD; the secondary electron energy distribution produced by gamma irradiation is from several eV to incident particle energy. As the scattering angle of secondary electron increases, the number of secondary electrons decreases. Therefore, a reasonable detector epitaxial thickness should be set in the anti-irradiation design of SDD. MDPI 2019-04-13 /pmc/articles/PMC6515204/ /pubmed/31013874 http://dx.doi.org/10.3390/s19081767 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Liu, Yang Zhu, Tengfei Yao, Jianxi Ouyang, Xiaoping Simulation of Radiation Damage for Silicon Drift Detector |
title | Simulation of Radiation Damage for Silicon Drift Detector |
title_full | Simulation of Radiation Damage for Silicon Drift Detector |
title_fullStr | Simulation of Radiation Damage for Silicon Drift Detector |
title_full_unstemmed | Simulation of Radiation Damage for Silicon Drift Detector |
title_short | Simulation of Radiation Damage for Silicon Drift Detector |
title_sort | simulation of radiation damage for silicon drift detector |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6515204/ https://www.ncbi.nlm.nih.gov/pubmed/31013874 http://dx.doi.org/10.3390/s19081767 |
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