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Influence of Refractive Index on Antireflectance Efficiency of Thin Films

In today’s world, scientific development is tremendously strengthened by imitating natural processes. This development remarkably validates progressive and efficient operation of multifunctional thin films in variable ecological circumstances. We use TFCalc thinfilm software, a reliable and trustwor...

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Autores principales: Khan, Sadaf Bashir, Irfan, Syed, Zhuanghao, Zheng, Lee, Shern Long
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6540266/
https://www.ncbi.nlm.nih.gov/pubmed/31067802
http://dx.doi.org/10.3390/ma12091483
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author Khan, Sadaf Bashir
Irfan, Syed
Zhuanghao, Zheng
Lee, Shern Long
author_facet Khan, Sadaf Bashir
Irfan, Syed
Zhuanghao, Zheng
Lee, Shern Long
author_sort Khan, Sadaf Bashir
collection PubMed
description In today’s world, scientific development is tremendously strengthened by imitating natural processes. This development remarkably validates progressive and efficient operation of multifunctional thin films in variable ecological circumstances. We use TFCalc thinfilm software, a reliable and trustworthy simulation tool, to design antireflective (AR) coatings for solar cells that can operate in varying environmental conditions and can be functional according to user-defined conditions. Silicon nearly reflects 36% light in the 550 nm wavelength region, causing a significant loss in solar cell efficiency. We used silicon as the substrate on which we designed and fabricated a trilayer inorganic oxide AR thin films, and this reduced it reflectance to <4% in the 300~800 nm wavelength range. Because of their distinguishing physical physiognomies, we used a combination of different inorganic oxides, comprising high-, low-, and medium-refractive indices, to model AR coatings in the desired wavelength range. Experimental implementation of the designed AR thin films in the present study unlocks new techniques for production of competent, wideband-tunable AR coatings that are applicable in high-performance photovoltaic applications.
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spelling pubmed-65402662019-06-05 Influence of Refractive Index on Antireflectance Efficiency of Thin Films Khan, Sadaf Bashir Irfan, Syed Zhuanghao, Zheng Lee, Shern Long Materials (Basel) Communication In today’s world, scientific development is tremendously strengthened by imitating natural processes. This development remarkably validates progressive and efficient operation of multifunctional thin films in variable ecological circumstances. We use TFCalc thinfilm software, a reliable and trustworthy simulation tool, to design antireflective (AR) coatings for solar cells that can operate in varying environmental conditions and can be functional according to user-defined conditions. Silicon nearly reflects 36% light in the 550 nm wavelength region, causing a significant loss in solar cell efficiency. We used silicon as the substrate on which we designed and fabricated a trilayer inorganic oxide AR thin films, and this reduced it reflectance to <4% in the 300~800 nm wavelength range. Because of their distinguishing physical physiognomies, we used a combination of different inorganic oxides, comprising high-, low-, and medium-refractive indices, to model AR coatings in the desired wavelength range. Experimental implementation of the designed AR thin films in the present study unlocks new techniques for production of competent, wideband-tunable AR coatings that are applicable in high-performance photovoltaic applications. MDPI 2019-05-07 /pmc/articles/PMC6540266/ /pubmed/31067802 http://dx.doi.org/10.3390/ma12091483 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Communication
Khan, Sadaf Bashir
Irfan, Syed
Zhuanghao, Zheng
Lee, Shern Long
Influence of Refractive Index on Antireflectance Efficiency of Thin Films
title Influence of Refractive Index on Antireflectance Efficiency of Thin Films
title_full Influence of Refractive Index on Antireflectance Efficiency of Thin Films
title_fullStr Influence of Refractive Index on Antireflectance Efficiency of Thin Films
title_full_unstemmed Influence of Refractive Index on Antireflectance Efficiency of Thin Films
title_short Influence of Refractive Index on Antireflectance Efficiency of Thin Films
title_sort influence of refractive index on antireflectance efficiency of thin films
topic Communication
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6540266/
https://www.ncbi.nlm.nih.gov/pubmed/31067802
http://dx.doi.org/10.3390/ma12091483
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