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Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects betwee...

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Detalles Bibliográficos
Autores principales:	Krivcov, Alexander, Ehrler, Jasmin, Fuhrmann, Marc, Junkers, Tanja, Möbius, Hildegard
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2019
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6541333/ https://www.ncbi.nlm.nih.gov/pubmed/31165032 http://dx.doi.org/10.3762/bjnano.10.106

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