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Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements
A combination of in situ electrical and grazing-incidence X-ray diffraction (GIXD) is a powerful tool for studies of correlations between the microstructure and charge transport in thin organic films. The information provided by such experimental approach can help optimizing the performance of the f...
Autores principales: | , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6542962/ https://www.ncbi.nlm.nih.gov/pubmed/31147864 http://dx.doi.org/10.1186/s11671-019-3009-8 |
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author | Mikayelyan, Eduard Grodd, Linda Ksianzou, Viachaslau Wesner, Daniel Rodygin, Alexander I. Schönherr, Holger Luponosov, Yuriy N. Ponomarenko, Sergei A. Ivanov, Dimitri A. Pietsch, Ullrich Grigorian, Souren |
author_facet | Mikayelyan, Eduard Grodd, Linda Ksianzou, Viachaslau Wesner, Daniel Rodygin, Alexander I. Schönherr, Holger Luponosov, Yuriy N. Ponomarenko, Sergei A. Ivanov, Dimitri A. Pietsch, Ullrich Grigorian, Souren |
author_sort | Mikayelyan, Eduard |
collection | PubMed |
description | A combination of in situ electrical and grazing-incidence X-ray diffraction (GIXD) is a powerful tool for studies of correlations between the microstructure and charge transport in thin organic films. The information provided by such experimental approach can help optimizing the performance of the films as active layers of organic electronic devices. In this work, such combination of techniques was used to investigate the phase transitions in vacuum-deposited thin films of a common organic semiconductor dihexyl-quarterthiophene (DH4T). A transition from the initial highly crystalline phase to a mesophase was detected upon heating, while only a partial backward transition was observed upon cooling to room temperature. In situ electrical conductivity measurements revealed the impact of both transitions on charge transport. This is partly accounted for by the fact that the initial crystalline phase is characterized by inclination of molecules in the plane perpendicular to the π-π stacking direction, whereas the mesophase is built of molecules tilted in the direction of π-π stacking. Importantly, in addition to the two phases of DH4T characteristic of the bulk, a third interfacial substrate-stabilized monolayer-type phase was observed. The existence of such interfacial structure can have important implications for the charge mobility, being especially favorable for lateral two-dimensional charge transport in the organic field-effect transistors geometry. |
format | Online Article Text |
id | pubmed-6542962 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | Springer US |
record_format | MEDLINE/PubMed |
spelling | pubmed-65429622019-06-19 Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements Mikayelyan, Eduard Grodd, Linda Ksianzou, Viachaslau Wesner, Daniel Rodygin, Alexander I. Schönherr, Holger Luponosov, Yuriy N. Ponomarenko, Sergei A. Ivanov, Dimitri A. Pietsch, Ullrich Grigorian, Souren Nanoscale Res Lett Nano Express A combination of in situ electrical and grazing-incidence X-ray diffraction (GIXD) is a powerful tool for studies of correlations between the microstructure and charge transport in thin organic films. The information provided by such experimental approach can help optimizing the performance of the films as active layers of organic electronic devices. In this work, such combination of techniques was used to investigate the phase transitions in vacuum-deposited thin films of a common organic semiconductor dihexyl-quarterthiophene (DH4T). A transition from the initial highly crystalline phase to a mesophase was detected upon heating, while only a partial backward transition was observed upon cooling to room temperature. In situ electrical conductivity measurements revealed the impact of both transitions on charge transport. This is partly accounted for by the fact that the initial crystalline phase is characterized by inclination of molecules in the plane perpendicular to the π-π stacking direction, whereas the mesophase is built of molecules tilted in the direction of π-π stacking. Importantly, in addition to the two phases of DH4T characteristic of the bulk, a third interfacial substrate-stabilized monolayer-type phase was observed. The existence of such interfacial structure can have important implications for the charge mobility, being especially favorable for lateral two-dimensional charge transport in the organic field-effect transistors geometry. Springer US 2019-05-30 /pmc/articles/PMC6542962/ /pubmed/31147864 http://dx.doi.org/10.1186/s11671-019-3009-8 Text en © The Author(s). 2019 Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. |
spellingShingle | Nano Express Mikayelyan, Eduard Grodd, Linda Ksianzou, Viachaslau Wesner, Daniel Rodygin, Alexander I. Schönherr, Holger Luponosov, Yuriy N. Ponomarenko, Sergei A. Ivanov, Dimitri A. Pietsch, Ullrich Grigorian, Souren Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements |
title | Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements |
title_full | Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements |
title_fullStr | Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements |
title_full_unstemmed | Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements |
title_short | Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements |
title_sort | phase transitions and formation of a monolayer-type structure in thin oligothiophene films: exploration with a combined in situ x-ray diffraction and electrical measurements |
topic | Nano Express |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6542962/ https://www.ncbi.nlm.nih.gov/pubmed/31147864 http://dx.doi.org/10.1186/s11671-019-3009-8 |
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