Remote Tracking of Phase Changes in Cr(2)AlC Thin Films by In-situ Resistivity Measurements

Resistivity changes of magnetron sputtered, amorphous Cr(2)AlC thin films were measured during heating in vacuum. Based on correlative X-ray diffraction, in-situ and ex-situ selected area electron diffraction measurements and differential scanning calorimetry data from literature it is evident that...

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Detalles Bibliográficos
Autores principales: Stelzer, Bastian, Chen, Xiang, Bliem, Pascal, Hans, Marcus, Völker, Bernhard, Sahu, Rajib, Scheu, Christina, Primetzhofer, Daniel, Schneider, Jochen M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6547878/
https://www.ncbi.nlm.nih.gov/pubmed/31164687
http://dx.doi.org/10.1038/s41598-019-44692-4
Descripción
Sumario:Resistivity changes of magnetron sputtered, amorphous Cr(2)AlC thin films were measured during heating in vacuum. Based on correlative X-ray diffraction, in-situ and ex-situ selected area electron diffraction measurements and differential scanning calorimetry data from literature it is evident that the resistivity changes at 552 ± 4 and 585 ± 13 °C indicate the phase transitions from amorphous to a hexagonal disordered solid solution structure and from the latter to MAX phase, respectively. We have shown that phase changes in Cr(2)AlC thin films can be revealed by in-situ measurements of thermally induced resistivity changes.

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