Remote Tracking of Phase Changes in Cr(2)AlC Thin Films by In-situ Resistivity Measurements

Resistivity changes of magnetron sputtered, amorphous Cr(2)AlC thin films were measured during heating in vacuum. Based on correlative X-ray diffraction, in-situ and ex-situ selected area electron diffraction measurements and differential scanning calorimetry data from literature it is evident that...

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Autores principales: Stelzer, Bastian, Chen, Xiang, Bliem, Pascal, Hans, Marcus, Völker, Bernhard, Sahu, Rajib, Scheu, Christina, Primetzhofer, Daniel, Schneider, Jochen M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6547878/
https://www.ncbi.nlm.nih.gov/pubmed/31164687
http://dx.doi.org/10.1038/s41598-019-44692-4
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author Stelzer, Bastian
Chen, Xiang
Bliem, Pascal
Hans, Marcus
Völker, Bernhard
Sahu, Rajib
Scheu, Christina
Primetzhofer, Daniel
Schneider, Jochen M.
author_facet Stelzer, Bastian
Chen, Xiang
Bliem, Pascal
Hans, Marcus
Völker, Bernhard
Sahu, Rajib
Scheu, Christina
Primetzhofer, Daniel
Schneider, Jochen M.
author_sort Stelzer, Bastian
collection PubMed
description Resistivity changes of magnetron sputtered, amorphous Cr(2)AlC thin films were measured during heating in vacuum. Based on correlative X-ray diffraction, in-situ and ex-situ selected area electron diffraction measurements and differential scanning calorimetry data from literature it is evident that the resistivity changes at 552 ± 4 and 585 ± 13 °C indicate the phase transitions from amorphous to a hexagonal disordered solid solution structure and from the latter to MAX phase, respectively. We have shown that phase changes in Cr(2)AlC thin films can be revealed by in-situ measurements of thermally induced resistivity changes.
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spelling pubmed-65478782019-06-12 Remote Tracking of Phase Changes in Cr(2)AlC Thin Films by In-situ Resistivity Measurements Stelzer, Bastian Chen, Xiang Bliem, Pascal Hans, Marcus Völker, Bernhard Sahu, Rajib Scheu, Christina Primetzhofer, Daniel Schneider, Jochen M. Sci Rep Article Resistivity changes of magnetron sputtered, amorphous Cr(2)AlC thin films were measured during heating in vacuum. Based on correlative X-ray diffraction, in-situ and ex-situ selected area electron diffraction measurements and differential scanning calorimetry data from literature it is evident that the resistivity changes at 552 ± 4 and 585 ± 13 °C indicate the phase transitions from amorphous to a hexagonal disordered solid solution structure and from the latter to MAX phase, respectively. We have shown that phase changes in Cr(2)AlC thin films can be revealed by in-situ measurements of thermally induced resistivity changes. Nature Publishing Group UK 2019-06-04 /pmc/articles/PMC6547878/ /pubmed/31164687 http://dx.doi.org/10.1038/s41598-019-44692-4 Text en © The Author(s) 2019 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Stelzer, Bastian
Chen, Xiang
Bliem, Pascal
Hans, Marcus
Völker, Bernhard
Sahu, Rajib
Scheu, Christina
Primetzhofer, Daniel
Schneider, Jochen M.
Remote Tracking of Phase Changes in Cr(2)AlC Thin Films by In-situ Resistivity Measurements
title Remote Tracking of Phase Changes in Cr(2)AlC Thin Films by In-situ Resistivity Measurements
title_full Remote Tracking of Phase Changes in Cr(2)AlC Thin Films by In-situ Resistivity Measurements
title_fullStr Remote Tracking of Phase Changes in Cr(2)AlC Thin Films by In-situ Resistivity Measurements
title_full_unstemmed Remote Tracking of Phase Changes in Cr(2)AlC Thin Films by In-situ Resistivity Measurements
title_short Remote Tracking of Phase Changes in Cr(2)AlC Thin Films by In-situ Resistivity Measurements
title_sort remote tracking of phase changes in cr(2)alc thin films by in-situ resistivity measurements
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6547878/
https://www.ncbi.nlm.nih.gov/pubmed/31164687
http://dx.doi.org/10.1038/s41598-019-44692-4
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