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Remote Tracking of Phase Changes in Cr(2)AlC Thin Films by In-situ Resistivity Measurements
Resistivity changes of magnetron sputtered, amorphous Cr(2)AlC thin films were measured during heating in vacuum. Based on correlative X-ray diffraction, in-situ and ex-situ selected area electron diffraction measurements and differential scanning calorimetry data from literature it is evident that...
| Autores principales: | , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6547878/ https://www.ncbi.nlm.nih.gov/pubmed/31164687 http://dx.doi.org/10.1038/s41598-019-44692-4 |