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Elemental Distribution and Structural Characterization of GaN/InGaN Core-Shell Single Nanowires by Hard X-ray Synchrotron Nanoprobes

Improvements in the spatial resolution of synchrotron-based X-ray probes have reached the nano-scale and they, nowadays, constitute a powerful platform for the study of semiconductor nanostructures and nanodevices that provides high sensitivity without destroying the material. Three complementary ha...

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Detalles Bibliográficos
Autores principales:	Secco, Eleonora, Mengistu, Heruy Taddese, Segura-Ruíz, Jaime, Martínez-Criado, Gema, García-Cristóbal, Alberto, Cantarero, Andrés, Foltynski, Bartosz, Behmenburg, Hannes, Giesen, Christoph, Heuken, Michael, Garro, Núria
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2019
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6566811/ https://www.ncbi.nlm.nih.gov/pubmed/31058842 http://dx.doi.org/10.3390/nano9050691

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