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Single-defect spectroscopy in the shortwave infrared

Chemical defects that fluoresce in the shortwave infrared open exciting opportunities in deep-penetration bioimaging, chemically specific sensing, and quantum technologies. However, the atomic size of defects and the high noise of infrared detectors have posed significant challenges to the studies o...

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Detalles Bibliográficos
Autores principales: Wu, Xiaojian, Kim, Mijin, Qu, Haoran, Wang, YuHuang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6572808/
https://www.ncbi.nlm.nih.gov/pubmed/31209262
http://dx.doi.org/10.1038/s41467-019-10788-8
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author Wu, Xiaojian
Kim, Mijin
Qu, Haoran
Wang, YuHuang
author_facet Wu, Xiaojian
Kim, Mijin
Qu, Haoran
Wang, YuHuang
author_sort Wu, Xiaojian
collection PubMed
description Chemical defects that fluoresce in the shortwave infrared open exciting opportunities in deep-penetration bioimaging, chemically specific sensing, and quantum technologies. However, the atomic size of defects and the high noise of infrared detectors have posed significant challenges to the studies of these unique emitters. Here we demonstrate high throughput single-defect spectroscopy in the shortwave infrared capable of quantitatively and spectrally resolving chemical defects at the single defect level. By cooling an InGaAs detector array down to −190 °C and implementing a nondestructive readout scheme, we are able to capture low light fluorescent events in the shortwave infrared with a signal-to-noise ratio improved by more than three orders-of-magnitude. As a demonstration, we show it is possible to resolve individual chemical defects in carbon nanotube semiconductors, simultaneously collecting a full spectrum for each defect within the entire field of view at the single defect limit.
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spelling pubmed-65728082019-06-24 Single-defect spectroscopy in the shortwave infrared Wu, Xiaojian Kim, Mijin Qu, Haoran Wang, YuHuang Nat Commun Article Chemical defects that fluoresce in the shortwave infrared open exciting opportunities in deep-penetration bioimaging, chemically specific sensing, and quantum technologies. However, the atomic size of defects and the high noise of infrared detectors have posed significant challenges to the studies of these unique emitters. Here we demonstrate high throughput single-defect spectroscopy in the shortwave infrared capable of quantitatively and spectrally resolving chemical defects at the single defect level. By cooling an InGaAs detector array down to −190 °C and implementing a nondestructive readout scheme, we are able to capture low light fluorescent events in the shortwave infrared with a signal-to-noise ratio improved by more than three orders-of-magnitude. As a demonstration, we show it is possible to resolve individual chemical defects in carbon nanotube semiconductors, simultaneously collecting a full spectrum for each defect within the entire field of view at the single defect limit. Nature Publishing Group UK 2019-06-17 /pmc/articles/PMC6572808/ /pubmed/31209262 http://dx.doi.org/10.1038/s41467-019-10788-8 Text en © The Author(s) 2019 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Wu, Xiaojian
Kim, Mijin
Qu, Haoran
Wang, YuHuang
Single-defect spectroscopy in the shortwave infrared
title Single-defect spectroscopy in the shortwave infrared
title_full Single-defect spectroscopy in the shortwave infrared
title_fullStr Single-defect spectroscopy in the shortwave infrared
title_full_unstemmed Single-defect spectroscopy in the shortwave infrared
title_short Single-defect spectroscopy in the shortwave infrared
title_sort single-defect spectroscopy in the shortwave infrared
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6572808/
https://www.ncbi.nlm.nih.gov/pubmed/31209262
http://dx.doi.org/10.1038/s41467-019-10788-8
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