A 3-D Projection Model for X-ray Dark-field Imaging

The X-ray dark-field signal can be measured with a grating-based Talbot-Lau interferometer. It measures small angle scattering of micrometer-sized oriented structures. Interestingly, the signal is a function not only of the material, but also of the relative orientation of the sample, the X-ray beam...

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Detalles Bibliográficos
Autores principales: Felsner, Lina, Hu, Shiyang, Maier, Andreas, Bopp, Johannes, Ludwig, Veronika, Anton, Gisela, Riess, Christian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6592954/
https://www.ncbi.nlm.nih.gov/pubmed/31239499
http://dx.doi.org/10.1038/s41598-019-45708-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6592954/
https://www.ncbi.nlm.nih.gov/pubmed/31239499
http://dx.doi.org/10.1038/s41598-019-45708-9

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