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A 3-D Projection Model for X-ray Dark-field Imaging
The X-ray dark-field signal can be measured with a grating-based Talbot-Lau interferometer. It measures small angle scattering of micrometer-sized oriented structures. Interestingly, the signal is a function not only of the material, but also of the relative orientation of the sample, the X-ray beam...
Autores principales: | Felsner, Lina, Hu, Shiyang, Maier, Andreas, Bopp, Johannes, Ludwig, Veronika, Anton, Gisela, Riess, Christian |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2019
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6592954/ https://www.ncbi.nlm.nih.gov/pubmed/31239499 http://dx.doi.org/10.1038/s41598-019-45708-9 |
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