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Capacitive Impedance Measurement: Dual-frequency Approach

The most widely used technique for measuring capacitive impedances (or complex electrical permittivity) is to apply a frequency signal to the sensor and measure the amplitude and phase of the output signal. The technique, although efficient, involves high-speed circuits for phase measurement, especi...

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Autores principales: Rêgo Segundo, Alan Kardek, Silva Pinto, Érica, Almeida Santos, Gabriel, de Barros Monteiro, Paulo Marcos
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6603569/
https://www.ncbi.nlm.nih.gov/pubmed/31167349
http://dx.doi.org/10.3390/s19112539
_version_ 1783431535390621696
author Rêgo Segundo, Alan Kardek
Silva Pinto, Érica
Almeida Santos, Gabriel
de Barros Monteiro, Paulo Marcos
author_facet Rêgo Segundo, Alan Kardek
Silva Pinto, Érica
Almeida Santos, Gabriel
de Barros Monteiro, Paulo Marcos
author_sort Rêgo Segundo, Alan Kardek
collection PubMed
description The most widely used technique for measuring capacitive impedances (or complex electrical permittivity) is to apply a frequency signal to the sensor and measure the amplitude and phase of the output signal. The technique, although efficient, involves high-speed circuits for phase measurement, especially when the medium under test has high conductivity. This paper presents a sensor to measure complex electrical permittivity based on an alternative approach to amplitude and phase measurement: The application of two distinct frequencies using a current-to-voltage converter circuit based in a transimpedance amplifier, and an 8-bit microcontroller. Since there is no need for phase measurement and the applied frequency is lower compared to the standard method, the circuit presents less complexity and cost than the traditional technique. The main advance presented in this work is the use of mathematical modeling of the frequency response of the circuit to make it possible for measuring the dielectric constant using a lower frequency than the higher cut-off frequency of the system, even when the medium under test has high conductivity (tested up to 1220 μS/cm). The proposed system caused a maximum error of 0.6% for the measurement of electrical conductivity and 2% for the relative dielectric constant, considering measurement ranges from 0 to 1220 μS/cm and from 1 to 80, respectively.
format Online
Article
Text
id pubmed-6603569
institution National Center for Biotechnology Information
language English
publishDate 2019
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-66035692019-07-17 Capacitive Impedance Measurement: Dual-frequency Approach Rêgo Segundo, Alan Kardek Silva Pinto, Érica Almeida Santos, Gabriel de Barros Monteiro, Paulo Marcos Sensors (Basel) Article The most widely used technique for measuring capacitive impedances (or complex electrical permittivity) is to apply a frequency signal to the sensor and measure the amplitude and phase of the output signal. The technique, although efficient, involves high-speed circuits for phase measurement, especially when the medium under test has high conductivity. This paper presents a sensor to measure complex electrical permittivity based on an alternative approach to amplitude and phase measurement: The application of two distinct frequencies using a current-to-voltage converter circuit based in a transimpedance amplifier, and an 8-bit microcontroller. Since there is no need for phase measurement and the applied frequency is lower compared to the standard method, the circuit presents less complexity and cost than the traditional technique. The main advance presented in this work is the use of mathematical modeling of the frequency response of the circuit to make it possible for measuring the dielectric constant using a lower frequency than the higher cut-off frequency of the system, even when the medium under test has high conductivity (tested up to 1220 μS/cm). The proposed system caused a maximum error of 0.6% for the measurement of electrical conductivity and 2% for the relative dielectric constant, considering measurement ranges from 0 to 1220 μS/cm and from 1 to 80, respectively. MDPI 2019-06-04 /pmc/articles/PMC6603569/ /pubmed/31167349 http://dx.doi.org/10.3390/s19112539 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Rêgo Segundo, Alan Kardek
Silva Pinto, Érica
Almeida Santos, Gabriel
de Barros Monteiro, Paulo Marcos
Capacitive Impedance Measurement: Dual-frequency Approach
title Capacitive Impedance Measurement: Dual-frequency Approach
title_full Capacitive Impedance Measurement: Dual-frequency Approach
title_fullStr Capacitive Impedance Measurement: Dual-frequency Approach
title_full_unstemmed Capacitive Impedance Measurement: Dual-frequency Approach
title_short Capacitive Impedance Measurement: Dual-frequency Approach
title_sort capacitive impedance measurement: dual-frequency approach
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6603569/
https://www.ncbi.nlm.nih.gov/pubmed/31167349
http://dx.doi.org/10.3390/s19112539
work_keys_str_mv AT regosegundoalankardek capacitiveimpedancemeasurementdualfrequencyapproach
AT silvapintoerica capacitiveimpedancemeasurementdualfrequencyapproach
AT almeidasantosgabriel capacitiveimpedancemeasurementdualfrequencyapproach
AT debarrosmonteiropaulomarcos capacitiveimpedancemeasurementdualfrequencyapproach