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Electron Tomography of Pencil-Shaped GaN/(In,Ga)N Core-Shell Nanowires

The three-dimensional structure of GaN/(In,Ga)N core-shell nanowires with multi-faceted pencil-shaped apex is analyzed by electron tomography using high-angle annular dark-field mode in a scanning transmission electron microscope. Selective area growth on GaN-on-sapphire templates using a patterned...

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Detalles Bibliográficos
Autores principales:	Nicolai, Lars, Gačević, Žarko, Calleja, Enrique, Trampert, Achim
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Springer US 2019
Materias:	Nano Express
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6626086/ https://www.ncbi.nlm.nih.gov/pubmed/31300916 http://dx.doi.org/10.1186/s11671-019-3072-1

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