Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator

In a MIS (Metal/Insulator/Semiconductor) structure consisting of two terminals, a systematic analysis of the electrical charge transport mechanism through an insulator is essential for advanced electronic application devices such as next-generation memories based on resistance differences. Herein, w...

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Detalles Bibliográficos
Autores principales: Lee, Donggun, Park, Jun-Woo, Cho, Nam-Kwang, Lee, Jinwon, Kim, Youn Sang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6635483/
https://www.ncbi.nlm.nih.gov/pubmed/31312002
http://dx.doi.org/10.1038/s41598-019-46752-1

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6635483/
https://www.ncbi.nlm.nih.gov/pubmed/31312002
http://dx.doi.org/10.1038/s41598-019-46752-1

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