Quantitative dual-energy micro-CT with a photon-counting detector for material science and non-destructive testing

The recent progress in photon-counting detector technology using high-Z semiconductor sensors provides new possibilities for spectral x-ray imaging. The benefits of the approach to extract spectral information directly from measurements in the projection domain are very advantageous for material sci...

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Detalles Bibliográficos
Autores principales: Sellerer, Thorsten, Ehn, Sebastian, Mechlem, Korbinian, Duda, Manuela, Epple, Michael, Noël, Peter B., Pfeiffer, Franz
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2019
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6636745/
https://www.ncbi.nlm.nih.gov/pubmed/31314812
http://dx.doi.org/10.1371/journal.pone.0219659

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6636745/
https://www.ncbi.nlm.nih.gov/pubmed/31314812
http://dx.doi.org/10.1371/journal.pone.0219659

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