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Quantitative dual-energy micro-CT with a photon-counting detector for material science and non-destructive testing
The recent progress in photon-counting detector technology using high-Z semiconductor sensors provides new possibilities for spectral x-ray imaging. The benefits of the approach to extract spectral information directly from measurements in the projection domain are very advantageous for material sci...
Autores principales: | Sellerer, Thorsten, Ehn, Sebastian, Mechlem, Korbinian, Duda, Manuela, Epple, Michael, Noël, Peter B., Pfeiffer, Franz |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Public Library of Science
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6636745/ https://www.ncbi.nlm.nih.gov/pubmed/31314812 http://dx.doi.org/10.1371/journal.pone.0219659 |
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