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Room-Temperature Routes Toward the Creation of Zinc Oxide Films from Molecular Precursors

[Image: see text] The fabrication of “flexible” electronics on plastic substrates with low melting points requires the development of thin-film deposition techniques that operate at low temperatures. This is easily achieved with vacuum- or solution-processed molecular or polymeric semiconductors, bu...

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Autores principales: Gonzalez Arellano, D. Leonardo, Bhamrah, Jasvir, Yang, Junwei, Gilchrist, James B., McComb, David W., Ryan, Mary P., Heutz, Sandrine
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2017
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6641057/
https://www.ncbi.nlm.nih.gov/pubmed/31457213
http://dx.doi.org/10.1021/acsomega.6b00324
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author Gonzalez Arellano, D. Leonardo
Bhamrah, Jasvir
Yang, Junwei
Gilchrist, James B.
McComb, David W.
Ryan, Mary P.
Heutz, Sandrine
author_facet Gonzalez Arellano, D. Leonardo
Bhamrah, Jasvir
Yang, Junwei
Gilchrist, James B.
McComb, David W.
Ryan, Mary P.
Heutz, Sandrine
author_sort Gonzalez Arellano, D. Leonardo
collection PubMed
description [Image: see text] The fabrication of “flexible” electronics on plastic substrates with low melting points requires the development of thin-film deposition techniques that operate at low temperatures. This is easily achieved with vacuum- or solution-processed molecular or polymeric semiconductors, but oxide materials remain a significant challenge. Here, we show that zinc oxide (ZnO) can be prepared using only room-temperature processes, with the molecular thin-film precursor zinc phthalocyanine (ZnPc), followed by UV-light treatment in vacuum to elicit degradation of the organic components and transformation of the deposited film to the oxide material. The degradation mechanism was assessed by studying the influence of the atmosphere during the reaction: it was particularly sensitive to the oxygen pressure in the chamber and optimal degradation conditions were established as 3 mbar with 40% oxygen in nitrogen. The morphology of the film remained relatively unchanged during the reaction, but a detailed analysis of its composition using both scanning transmission electron microscopy and secondary ion mass spectrometry revealed that a 40 nm thick layer containing ZnO results from the 100 nm thick precursor after complete reaction. Our methodology represents a simple route for the fabrication of oxides and multilayer structures that can be easily integrated into current molecular thin-film growth setups, without the need for a high-temperature step.
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spelling pubmed-66410572019-08-27 Room-Temperature Routes Toward the Creation of Zinc Oxide Films from Molecular Precursors Gonzalez Arellano, D. Leonardo Bhamrah, Jasvir Yang, Junwei Gilchrist, James B. McComb, David W. Ryan, Mary P. Heutz, Sandrine ACS Omega [Image: see text] The fabrication of “flexible” electronics on plastic substrates with low melting points requires the development of thin-film deposition techniques that operate at low temperatures. This is easily achieved with vacuum- or solution-processed molecular or polymeric semiconductors, but oxide materials remain a significant challenge. Here, we show that zinc oxide (ZnO) can be prepared using only room-temperature processes, with the molecular thin-film precursor zinc phthalocyanine (ZnPc), followed by UV-light treatment in vacuum to elicit degradation of the organic components and transformation of the deposited film to the oxide material. The degradation mechanism was assessed by studying the influence of the atmosphere during the reaction: it was particularly sensitive to the oxygen pressure in the chamber and optimal degradation conditions were established as 3 mbar with 40% oxygen in nitrogen. The morphology of the film remained relatively unchanged during the reaction, but a detailed analysis of its composition using both scanning transmission electron microscopy and secondary ion mass spectrometry revealed that a 40 nm thick layer containing ZnO results from the 100 nm thick precursor after complete reaction. Our methodology represents a simple route for the fabrication of oxides and multilayer structures that can be easily integrated into current molecular thin-film growth setups, without the need for a high-temperature step. American Chemical Society 2017-01-12 /pmc/articles/PMC6641057/ /pubmed/31457213 http://dx.doi.org/10.1021/acsomega.6b00324 Text en Copyright © 2017 American Chemical Society This is an open access article published under a Creative Commons Attribution (CC-BY) License (http://pubs.acs.org/page/policy/authorchoice_ccby_termsofuse.html) , which permits unrestricted use, distribution and reproduction in any medium, provided the author and source are cited.
spellingShingle Gonzalez Arellano, D. Leonardo
Bhamrah, Jasvir
Yang, Junwei
Gilchrist, James B.
McComb, David W.
Ryan, Mary P.
Heutz, Sandrine
Room-Temperature Routes Toward the Creation of Zinc Oxide Films from Molecular Precursors
title Room-Temperature Routes Toward the Creation of Zinc Oxide Films from Molecular Precursors
title_full Room-Temperature Routes Toward the Creation of Zinc Oxide Films from Molecular Precursors
title_fullStr Room-Temperature Routes Toward the Creation of Zinc Oxide Films from Molecular Precursors
title_full_unstemmed Room-Temperature Routes Toward the Creation of Zinc Oxide Films from Molecular Precursors
title_short Room-Temperature Routes Toward the Creation of Zinc Oxide Films from Molecular Precursors
title_sort room-temperature routes toward the creation of zinc oxide films from molecular precursors
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6641057/
https://www.ncbi.nlm.nih.gov/pubmed/31457213
http://dx.doi.org/10.1021/acsomega.6b00324
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