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Thin-Film Carbon Nanofuses for Permanent Data Storage

[Image: see text] In this study, we have fabricated nanofuses from thin-film, arc-deposited carbon for use in permanent data storage. Thin-film carbon fuses have fewer fabrication barriers and retain the required resistivity and structural stability to act as a data-storage medium. Carbon thin films...

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Autores principales: Laughlin, Kevin R., Jamieson, Sarah, Pearson, Anthony C., Wang, Hao, Vanfleet, Richard R., Davis, Robert C., Linford, Matthew R., Lunt, Barry M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2017
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6641109/
https://www.ncbi.nlm.nih.gov/pubmed/31457591
http://dx.doi.org/10.1021/acsomega.7b00025
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author Laughlin, Kevin R.
Jamieson, Sarah
Pearson, Anthony C.
Wang, Hao
Vanfleet, Richard R.
Davis, Robert C.
Linford, Matthew R.
Lunt, Barry M.
author_facet Laughlin, Kevin R.
Jamieson, Sarah
Pearson, Anthony C.
Wang, Hao
Vanfleet, Richard R.
Davis, Robert C.
Linford, Matthew R.
Lunt, Barry M.
author_sort Laughlin, Kevin R.
collection PubMed
description [Image: see text] In this study, we have fabricated nanofuses from thin-film, arc-deposited carbon for use in permanent data storage. Thin-film carbon fuses have fewer fabrication barriers and retain the required resistivity and structural stability to act as a data-storage medium. Carbon thin films were characterized for their electrical, microstructural, and chemical bonding properties. Annealing these films in an argon environment at 400 °C reduced the resistivity from about 4 × 10(–2) Ω cm as deposited to about 5 × 10(–4) Ω cm, allowing a lower blowing voltage. Nanofuses with widths ranging from 200 to 60 nm were fabricated and tested. They blow with voltages between 2 and 5.5 V, and the nanofuses remain stable in both “1” and “0” states under a constantly applied read voltage of 1 V for over 90 h.
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spelling pubmed-66411092019-08-27 Thin-Film Carbon Nanofuses for Permanent Data Storage Laughlin, Kevin R. Jamieson, Sarah Pearson, Anthony C. Wang, Hao Vanfleet, Richard R. Davis, Robert C. Linford, Matthew R. Lunt, Barry M. ACS Omega [Image: see text] In this study, we have fabricated nanofuses from thin-film, arc-deposited carbon for use in permanent data storage. Thin-film carbon fuses have fewer fabrication barriers and retain the required resistivity and structural stability to act as a data-storage medium. Carbon thin films were characterized for their electrical, microstructural, and chemical bonding properties. Annealing these films in an argon environment at 400 °C reduced the resistivity from about 4 × 10(–2) Ω cm as deposited to about 5 × 10(–4) Ω cm, allowing a lower blowing voltage. Nanofuses with widths ranging from 200 to 60 nm were fabricated and tested. They blow with voltages between 2 and 5.5 V, and the nanofuses remain stable in both “1” and “0” states under a constantly applied read voltage of 1 V for over 90 h. American Chemical Society 2017-06-02 /pmc/articles/PMC6641109/ /pubmed/31457591 http://dx.doi.org/10.1021/acsomega.7b00025 Text en Copyright © 2017 American Chemical Society This is an open access article published under an ACS AuthorChoice License (http://pubs.acs.org/page/policy/authorchoice_termsofuse.html) , which permits copying and redistribution of the article or any adaptations for non-commercial purposes.
spellingShingle Laughlin, Kevin R.
Jamieson, Sarah
Pearson, Anthony C.
Wang, Hao
Vanfleet, Richard R.
Davis, Robert C.
Linford, Matthew R.
Lunt, Barry M.
Thin-Film Carbon Nanofuses for Permanent Data Storage
title Thin-Film Carbon Nanofuses for Permanent Data Storage
title_full Thin-Film Carbon Nanofuses for Permanent Data Storage
title_fullStr Thin-Film Carbon Nanofuses for Permanent Data Storage
title_full_unstemmed Thin-Film Carbon Nanofuses for Permanent Data Storage
title_short Thin-Film Carbon Nanofuses for Permanent Data Storage
title_sort thin-film carbon nanofuses for permanent data storage
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6641109/
https://www.ncbi.nlm.nih.gov/pubmed/31457591
http://dx.doi.org/10.1021/acsomega.7b00025
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